Large-scale broad-band parasitic extraction for fast layout verification of 3-D RF and mixed-signal on-chip structures

MLA

Ling, Feng, et al. “Large-Scale Broad-Band Parasitic Extraction for Fast Layout Verification of 3-D RF and Mixed-Signal on-Chip Structures.” IEEE Transactions on Microwave Theory and Techniques, vol. 53, no. 1, Jan. 2005, p. 264. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.128206708&authtype=sso&custid=ns315887.

APA

Ling, F., Okhmatovski, V. I., Harris, W., McCracken, S., & Dengi, A. (2005). Large-scale broad-band parasitic extraction for fast layout verification of 3-D RF and mixed-signal on-chip structures. IEEE Transactions on Microwave Theory and Techniques, 53(1), 264.

Chicago

Ling, Feng, Vladimir I. Okhmatovski, Warren Harris, Stephen McCracken, and Aykut Dengi. 2005. “Large-Scale Broad-Band Parasitic Extraction for Fast Layout Verification of 3-D RF and Mixed-Signal on-Chip Structures.” IEEE Transactions on Microwave Theory and Techniques 53 (1): 264. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.128206708&authtype=sso&custid=ns315887.