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Fabrication and characterization of low-loss TFMS on silicon substrate up to 220 GHz
- Source :
- IEEE Transactions on Microwave Theory and Techniques. Jan, 2005, Vol. 53 Issue 1, p301, 5 p.
- Publication Year :
- 2005
-
Abstract
- This paper presents the results of the fabrication and characterization up to 220 GHz, of thin-film microstrip (TFMS) transmission-line structures. The transmission lines are fabricated on a low-resistivity silicon substrate ([rho] = 10 [ohm] * cm). TFMS lines with a thick dielectric layer (20 [micro]m of benzocyclobutene is used here) present losses of 0.3 dB/mm at 94 GHz and 0.6 dB/mm at 220 GHz. Thus, using this technology, it will be possible to develop monolithic microwave integrated circuits on a silicon substrate. Index Terms--Dielectric film, low-resistivity silicon substrate, silicon, silicon monolithic microwave integrated circuits (MMICs), transmission lines.
Details
- Language :
- English
- ISSN :
- 00189480
- Volume :
- 53
- Issue :
- 1
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Microwave Theory and Techniques
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.128206712