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Characterization of a self-magnetic-pinched diode

Authors :
Hinshelwood, David
Cooperstein, G.
Mosher, D.
Ponce, D.M.
Strasburg, S.D.
Swanekamp, S.B.
Stephanakis, S.J.
Weber, B.V.
Young, F.C.
Critchley, A.
Crotch, I.
Threadgold, J.
Source :
IEEE Transactions on Plasma Science. April, 2005, Vol. 33 Issue 2, p696, 8 p.
Publication Year :
2005

Abstract

Self-magnetic-pinched diode behavior at 1.5-2 MV was diagnosed using a variety of electrical, radiation, and optical diagnostics. Results are compared with predictions of the LSP particle-in-cell code, and shown to be in good agreement. A practical diagnostic of electron incidence angles is demonstrated. A quadrature interferometer is shown to be capable of measuring the time-dependent position of the effective electrode-plasma boundaries. Both one-dimensional (1-D) and two-dimensional (2-D) interferometry show the importance of anode plasma expansion in such diodes with high anode-power concentration. Not only does the anode plasma contribute significantly to gap closure, but there is evidence that anode plasma expansion results in a distortion of the effective anode shape, which can significantly affect the diode performance. Index Terms--Electron beams, particle beams, pinched-beam diodes, pulsed power, radiography.

Details

Language :
English
ISSN :
00933813
Volume :
33
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Plasma Science
Publication Type :
Academic Journal
Accession number :
edsgcl.132050478