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Characterization of a self-magnetic-pinched diode
- Source :
- IEEE Transactions on Plasma Science. April, 2005, Vol. 33 Issue 2, p696, 8 p.
- Publication Year :
- 2005
-
Abstract
- Self-magnetic-pinched diode behavior at 1.5-2 MV was diagnosed using a variety of electrical, radiation, and optical diagnostics. Results are compared with predictions of the LSP particle-in-cell code, and shown to be in good agreement. A practical diagnostic of electron incidence angles is demonstrated. A quadrature interferometer is shown to be capable of measuring the time-dependent position of the effective electrode-plasma boundaries. Both one-dimensional (1-D) and two-dimensional (2-D) interferometry show the importance of anode plasma expansion in such diodes with high anode-power concentration. Not only does the anode plasma contribute significantly to gap closure, but there is evidence that anode plasma expansion results in a distortion of the effective anode shape, which can significantly affect the diode performance. Index Terms--Electron beams, particle beams, pinched-beam diodes, pulsed power, radiography.
Details
- Language :
- English
- ISSN :
- 00933813
- Volume :
- 33
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Plasma Science
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.132050478