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EDA leaders getting serious about automatic test generation

Authors :
Tuck, Barbara
Source :
Computer Design. September, 1992, Vol. 31 Issue 9, p33, 3 p.
Publication Year :
1992

Abstract

The complexity of both silicon and the systems into which it's going is forcing designers to higher levels of abstraction for complex ASICs, and the use of synthesis is putting […]

Details

Language :
English
ISSN :
00104566
Volume :
31
Issue :
9
Database :
Gale General OneFile
Journal :
Computer Design
Publication Type :
Academic Journal
Accession number :
edsgcl.13429368