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Effect of ohmic contact conductance on the distribution of surface and bulk currents in semiconductor planar devices

Authors :
Chong-ru Huo
Ben-Yuan Gu
Coluzza, C.
Source :
Journal of Applied Physics. August 15, 1992, Vol. 72 Issue 4, p1473, 5 p.
Publication Year :
1992

Abstract

The effect of ohmic contact conductance on the distribution of surface and bulk currents in semiconductor planar devices was investigated. The results showed that current distribution was significantly affected by the contact conductance and the ratio between the shunt currents from probes one to two, and from one to three were mainly dominated by the contact and surface conductivities in the sample.

Details

ISSN :
00218979
Volume :
72
Issue :
4
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.13806686