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Molecular beam epitaxial growth and evaluation of intrinsic and extrinsically doped Hg0.8Cd0.2Te on (100) Cd0.96Zn0.04Te

Authors :
He, L.
Becker, C.R.
Bicknell-Tassius, R.N.
Scholl, S.
Landwehr, G.
Source :
Journal of Applied Physics. April 1, 1993, Vol. 73 Issue 7, p3305, 8 p.
Publication Year :
1993

Abstract

Research was conducted on (100) Hg1-xCdxTe epilayers grown via molecular beam epitaxy based on various Hg and Te flux ratios. The Hg and Te flux ratios were found to significantly influence hillockdensity, electron concentration and electron mobility. Results also showed thatoptimal Hg ad Te ratios reduced structural defects caused by nonstoichiometry.

Details

ISSN :
00218979
Volume :
73
Issue :
7
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.14046374