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A new technique to decompose closely spaced interface and bulk trap states using temperature dependent pulse-width deep level transient spectroscopy method: an application to PT/CdS photodetector
- Source :
- Journal of Applied Physics. Jan 15, 1993, Vol. 73 Issue 2, p760, 7 p.
- Publication Year :
- 1993
-
Abstract
- A new technique for the decomposition of closely spaced interface and bulk deep trap states was presented. The technique utilizes temperature-dependent pulse-width deep level transient spectroscopy to separate two bulk trap states and one continuously distributed interface state in a Pt/CdS photodiode, thus allowing a more accurate measurement of the physical parametrs to be obtained.
Details
- ISSN :
- 00218979
- Volume :
- 73
- Issue :
- 2
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.14133861