Nanoscale potential distribution across multiquantum well structures: Kelvin probe force microscopy and secondary electron imaging

Authors :: Schwarzman, A.
Barnham, K.
Strassburg, E.
Barkay, Z.
Grunbaum, E.
Mazzer, M.
Lepkifker, E.
Glatzel, Th.
Boag, A.
Rosenwaks, Y.
Source :: Journal of Applied Physics. Oct 15, 2005, Vol. 98 Issue 8, p084310-1, 4 p.
Publication Year :: 2005
Abstract: In0.17GaAs/GaAsP0.06 multiquantum well structures, together with secondary electron microscopy are characterized using ultrahigh vacuum cross-sectional Kelvin probe force microscopy. Individual 8 nm quantum wells are well resolved in both methods, and are found to be in good agreement with numerical simulations of the work function profile.

Subjects :: Quantum wells -- Structure
Electron microscopy -- Usage
Gallium arsenide semiconductors -- Design and construction
Physics

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