Evaluation of insulator thickness excitation-wavelength dependence of photoluminescence of CdSe/ZnS nanocrystals

The visualization and thickness evaluation for the insulator patterns through the photoluminescence (PL) measurement of CdSe/ZnS nanocrystals (NCs) placed on the patterns is demonstrated. The effective excitation intensity for CdSe/ZnS nanocrytsals (NCs) depends on the insulator thickness and excitation wavelength through the multireflection/interference of the excitation light.