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The study of emitter thickness effect on the heterostructure emitter bipolar transistors

Authors :
Chen, H.R.
Lee, C.P.
Chang, C.Y.
Tsang, J.S.
Tsai, K.L.
Source :
Journal of Applied Physics. July 15, 1993, Vol. 74 Issue 2, p1398, 5 p.
Publication Year :
1993

Abstract

The effect of variations of emitter thickness, from 300 to 900 angstroms, on the growth of AlGaAs/GaAs heterostructure emitter bipolar transistors is investigated. The emitter thickness effects on the current gain and offset voltage are also studied. The results show that the emitter thickness influences the current gain and offset voltage.

Details

ISSN :
00218979
Volume :
74
Issue :
2
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.14239820