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Distribution and potential distribution induced by single dislocations in GaN

Authors :
Gmeinwieser, N.
Gottfriedsen, P.
Schwarz, U.T.
Wegscheider, W.
Clos, R.
Krtschil, A.
Krost, A.
Weimar, A.
Bruderl, G.
Lell, A.
Harle, V.
Source :
Journal of Applied Physics. Dec 1, 2005, Vol. 98 Issue 11, p116102-1, 3 p.
Publication Year :
2005

Abstract

The presence of a threading edge dislocation terminated at the surface of GaN bulk substrates causes a dipole-like strain state ranging over a several micrometer square area. The results are compared with the local electrical potential distortion due to the core charge and attracted defects as analyzed by scanning surface-potential microscopy.

Details

Language :
English
ISSN :
00218979
Volume :
98
Issue :
11
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.142807735