Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conduction-probe atomic force microscopy

Authors :: Engelkes, Vincent B.
Beebe, Jeremy M.
Frisbie, C. Daniel
Source :: Journal of Physical Chemistry B. Sept 8, 2005, Vol. 109 Issue 35, p16801, 10 p.
Publication Year :: 2005
Abstract: Alkanethiol tunnel junctions are studied using conducting-probe atomic force microscopy to determine the causes of variability in measured resistance behavior. It is observed that controlling parameters like substrate roughness, tip chemistry, presence of solvent, and extensive tip usage can reduce junction resistance measurements.

Subjects :: Atomic force microscopy -- Usage
Monomolecular films -- Design and construction
Electric resistance -- Measurement
Thiols -- Electric properties
Alkanes -- Electric properties
Chemicals, plastics and rubber industries

Tools