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Better device yields with modulation spectroscopy

Authors :
Pollak, Fred H.
Hoa Qiang
Dong Yan
Yichun Yin
Boccio, Vincent T.
Source :
Photonics Spectra. August, 1993, Vol. 27 Issue 8, p78, 6 p.
Publication Year :
1993

Subjects

Subjects :
Semiconductors -- Optical properties
Photoelectron spectroscopy -- Usage
Business
Electronics and electrical industries
Engineering and manufacturing industries

Details

ISSN :
07311230
Volume :
27
Issue :
8
Database :
Gale General OneFile
Journal :
Photonics Spectra
Publication Type :
Periodical
Accession number :
edsgcl.14378715

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