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Testing fully diffused blocks embedded in complex ASICs

Authors :
Tuck, Barbara
Source :
Computer Design. August, 1993, Vol. 32 Issue 8, pS12, 6 p.
Publication Year :
1993

Abstract

Is BIST the best strategy for embedded memory? Will the overhead for testability be worth it? What are the testability issues for analog blocks? How important is at-speed emulation for […]

Details

Language :
English
ISSN :
00104566
Volume :
32
Issue :
8
Database :
Gale General OneFile
Journal :
Computer Design
Publication Type :
Academic Journal
Accession number :
edsgcl.14412706