A complete scheme of built-in self-test (BIST) structure for fault diagnosis in analog circuits and systems

Subjects

Subjects :

Electronic circuits -- Evaluation
Complementary metal oxide semiconductors -- Usage
Automatic testing equipment -- Usage

Details

ISSN :

00189456

Volume :

v42

Issue :

n3

Database :

Gale General OneFile

Journal :

IEEE Transactions on Instrumentation & Measurement

Publication Type :

Academic Journal

Accession number :

edsgcl.14521159