On the epitaxy of twin-free cubic (111) praseodymium sesquioxide films on Si(111)

Twin-free epitaxial cubic (111) praseodymium sesquioxide films were prepared on Si(111) by hexagonal-to-cubic phase transition and synchrotron radiation grazing incidence X-ray diffraction and transmission electron microscopy were applied to characterize the phase transition and the film structure. Transmission electron microscopy shows that the phase transition is accompanied by an interface reaction at the oxide/Si(111) boundary.