Near edge X-ray adsorption fine structure study of aligned pi-bonded carbon structure in nitrogenated ta-C films

Authors :: Roy, S.S.
McCann, R.
Papakonstantinou, P.
McLaughlin, J.A.
Kirkman, I.W.
Bhattacharya, S.
Silva, S.R.P.
Source :: Journal of Applied Physics. Feb 15, 2006, Vol. 99 Issue 4, p043511-1, 5 p.
Publication Year :: 2006
Abstract: Aligned pi-bonded carbon structure in nitrogenated ta-C films was studied with the help of near egde x-ray absorption fine structure (NEXAFS). The analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-Cn films and suggests an unusual and almost thermally stable nitrogenated carbon structure.

Subjects :: Thin films -- Atomic properties
Annealing -- Research
Carbon compounds -- Structure
Carbon compounds -- Atomic properties
Dielectric films -- Atomic properties
Physics

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