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Light induced electrostatic force spectroscopy: Application to local electronic transitions in InN epifilms

Authors :
W.S. Su
Y.F. Chen
T.Y. Lin
E.H. Lin
P.H. Chang; C.F. Shih; K.S. Liu
C.F. Shih
K.S. Liu
Source :
Journal of Applied Physics. March 1, 2006, Vol. 99 Issue 5, p053518-1, 4 p.
Publication Year :
2006

Abstract

A technique based on electrostatic force microscopy in which light is used to change the charge states of the local region in a solid is introduced and demonstrated. This technique provides a unique feature that it could be used to probe local electronic transitions of a solid in a submicron scale and it is also applied to study the local electronic structure in InN epifilms.

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
5
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.146410222