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Atomic scale characterization of layered ternary Cr2AlC ceramic

Authors :
Zhijun Lin
Yanchun Zhuo
Meishuan Li
Jingyang Wang
Source :
Journal of Applied Physics. April 1, 2006, Vol. 99 Issue 7, p076109-1, 3 p.
Publication Year :
2006

Abstract

The atomic scale microstructure is reported and the layer sacking sequence of Cr and Al atoms is clearly resolved. The electron energy loss spectroscopic analysis reveals that the Cr-C bonds in Cr2AlC are characterized by a strong sigma bonding.

Subjects

Subjects :
Chromium compounds -- Atomic properties
Aluminum compounds -- Atomic properties
Carbon compounds -- Atomic properties
Transmission electron microscopes -- Usage
Crystals -- Structure
Crystals -- Analysis
Physics

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
7
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.146463317

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