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Single-event-upset-like fault injection: a comprehensive framework

Authors :
Faure, Fabien
Velazco, Raoul
Peronnard, Paul
Source :
IEEE Transactions on Nuclear Science. Dec, 2005, Vol. 52 Issue 6, p2205, 5 p.
Publication Year :
2005

Abstract

An approach to reproduce radiation ground testing results for the study of microprocessors vulnerability to single event upset (SEU) is described in this paper. Resulting cross-sections fit very well with measured ones. Index Terms--Fault injection, microprocessor, single event upsets.

Subjects

Subjects :
Central processing units -- Research
Microprocessors -- Research
Fault tolerance (Computers) -- Research
Microprocessor
Microprocessor upgrade
Fault tolerance
Business
Electronics
Electronics and electrical industries

Details

Language :
English
ISSN :
00189499
Volume :
52
Issue :
6
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.149460099

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