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Surface chirality of CuO thin films
- Source :
- Journal of the American Chemical Society. Nov 1, 2006, Vol. 128 Issue 43, p14103, 6 p.
- Publication Year :
- 2006
-
Abstract
- The X-ray photoelectron spectroscopy (XPS) and X-ray photoelectron diffraction (XPD) investigations are presented for the CuO thin films electrochemically deposited on an Au(001) single-crystal surface from a solution containing chiral tartaric acid (TA). The results have shown that the formation of chiral CuO surfaces through electrodeposition in a solution-based process is possible down to film thicknesses of a few nanometers.
Details
- Language :
- English
- ISSN :
- 00027863
- Volume :
- 128
- Issue :
- 43
- Database :
- Gale General OneFile
- Journal :
- Journal of the American Chemical Society
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.155848481