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Test high-speed drivers with bursts and pseudorandom bit patterns

Authors :
Pfaff, Andreas
Source :
EDN. May 12, 1994, Vol. 39 Issue 10, p133, 3 p.
Publication Year :
1994

Abstract

Combine a high-performance, dual-channel pulse generator having burst and pseudorandom bit-stream capabilities with a high-band-width sampling oscilloscope for an effective and reliable way to characterize high-speed drivers. Both manufacturers and [...]

Subjects

Subjects :
Pulse generators -- Usage
Testing -- Usage
Bit manipulation -- Usage
Waveforms -- Usage
Business
Electronics and electrical industries
Usage

Details

Language :
English
ISSN :
00127515
Volume :
39
Issue :
10
Database :
Gale General OneFile
Journal :
EDN
Publication Type :
Periodical
Accession number :
edsgcl.15592539

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Authors Abstract Subjects Details