Characterization of the main semiconductor laser static and dynamic working parameters from CW optical spectrum measurements

A process for the complete experimental evaluation of the main working parameters for semiconductor lasers applicable to several types of market-available semiconductor lasers is described. The main advantage of the method is that it requires the use of only one setup for all the measurements, thereby making it much faster and easier to automate and could be applied to other types of single-mode semiconductor lasers without further revisions.