Optical and magneto-optical constants of Pr substituted TbFeCo films

Authors :: Carey, R.
Newman, D.M.
Snelling, J.P.
Thomas, B.W.J.
Source :: Journal of Applied Physics. May 15, 1994, Vol. 75 Issue 10, p7087, 3 p.
Publication Year :: 1994
Abstract: Kerr polarimetry and ellipsometry measure magnetooptical and optical constants of Pr-substituted TbFeCo films placed between SiN passivation layers developed from rf magnetron sputtering process. The Pr component decreases magnetooptic (MO) film thickness, increases ellipticity of films and degrades the MO activity of the films. MO and optical constants evaluated are used in trilayer structure modeling for MO media system usage.