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Crystallinity and I-V characteristics of Ag thin films deposited on fractal substrates

Authors :
Yu-Qing Xu
Jing-Song Wang
Gao-Xiang Ye
Qi-Rui Zhang
Source :
Journal of Applied Physics. Sept 1, 1994, Vol. 76 Issue 5, p2748, 4 p.
Publication Year :
1994

Abstract

Rf magnetron sputtered-Ag thin films on fractal substrates have defective nonlinear I-V characteristics, poor crystallinity and fractal conformation with several holes on the film surfaces. Nonlinear I-V characteristics increase directly with substrate temperature and inversely with film thickness and substrate temperature. Film thickness and substrate temperature also affect distribution activity of the junctions, causing the nonlinear I-V properties.

Details

ISSN :
00218979
Volume :
76
Issue :
5
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.16377562