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Use of the dirichlet process for reliability analysis
- Source :
- Computers & Industrial Engineering. Sept, 1994, Vol. v27 Issue n1-4, p339, 5 p.
- Publication Year :
- 1994
-
Abstract
- Recently, many researchers apply the non-parametric Bayesian approach to predict the reliability of highly complex electronic systems. The Dirichlet process is the most common model for the non-parametric Bayesian analysis. The Kuo's simulation procedure [6] for Dirichlet process under a variance reduction techniques introduced in Chien and Kuo (1994) [2] is applied for a Weibull-distributed system. Optimal burn-in time is determined given the cost parameters. A model, the percentage of good items in a lot, is used to explain when the Dirichlet process is not a proper choice. Keywords: Dirichlet process, Weibull distribution, simulation, variance reduction, burn-in
Details
- ISSN :
- 03608352
- Volume :
- v27
- Issue :
- n1-4
- Database :
- Gale General OneFile
- Journal :
- Computers & Industrial Engineering
- Publication Type :
- Periodical
- Accession number :
- edsgcl.16566451