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Electronic excitation in synthetic eumelanin aggregates probed by soft X-ray spectroscopies

Authors :
Sangaletti, L.
Pagliara, S.
Vilmercati, P.
Castellarin-Cudia C.
Borghetti, P.
Galinetto, P.
Gebauer, R.
Goldoni, A.
Source :
Journal of Physical Chemistry B. May 17, 2007, Vol. 111 Issue 19, 5372-5376
Publication Year :
2007

Abstract

The soft X-ray spectroscopy was used to investigate the electronic excitations of condensed phase eumelanin aggregate. The resonant photoemission data has shown that mechanisms of charge delocalization might occur when electrons are excited about 3 eV above the first unoccupied electronic level.

Details

Language :
English
ISSN :
15206106
Volume :
111
Issue :
19
Database :
Gale General OneFile
Journal :
Journal of Physical Chemistry B
Publication Type :
Academic Journal
Accession number :
edsgcl.166174387