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Influence of IrMn exchange bias layer on the magnetic properties of half-ring NiFe micron structures

Authors :
L.J. Chang
A.L. Chen
K.W. Cheng
C. Yu
S.F. Lee
Y. Liou
Y.D. Yao
Source :
Journal of Applied Physics. Nov 1, 2006, Vol. 100 Issue 9, 09F511-1-09F511-3
Publication Year :
2006

Abstract

The effect of IrMn exchange bias layer and the magnetization reversal behavior in half-ring NiFe structures are analyzed. It is shown that the hysteresis loops are shifted to one side because of the exchange coupling and the two-step switching seen in the single half-ring film is retained when the relative strength between the exchange field and the shape anisotropy is weak.

Details

Language :
English
ISSN :
00218979
Volume :
100
Issue :
9
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.166683210