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Influence of IrMn exchange bias layer on the magnetic properties of half-ring NiFe micron structures
- Source :
- Journal of Applied Physics. Nov 1, 2006, Vol. 100 Issue 9, 09F511-1-09F511-3
- Publication Year :
- 2006
-
Abstract
- The effect of IrMn exchange bias layer and the magnetization reversal behavior in half-ring NiFe structures are analyzed. It is shown that the hysteresis loops are shifted to one side because of the exchange coupling and the two-step switching seen in the single half-ring film is retained when the relative strength between the exchange field and the shape anisotropy is weak.
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 100
- Issue :
- 9
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.166683210