Cost-driven optimization of coverage of combined built-in self-test/automated test equipment testing

MLA

Shanrui Zhang, et al. “Cost-Driven Optimization of Coverage of Combined Built-in Self-Test/Automated Test Equipment Testing.” IEEE Transactions on Instrumentation & Measurement, vol. 56, no. 3, June 2007, p. 1094. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.167147664&authtype=sso&custid=ns315887.

APA

Shanrui Zhang, Minsu Choi, Park, N., & Lombardi, F. (2007). Cost-driven optimization of coverage of combined built-in self-test/automated test equipment testing. IEEE Transactions on Instrumentation & Measurement, 56(3), 1094.

Chicago

Shanrui Zhang, Minsu Choi, Nohpill Park, and Fabrizio Lombardi. 2007. “Cost-Driven Optimization of Coverage of Combined Built-in Self-Test/Automated Test Equipment Testing.” IEEE Transactions on Instrumentation & Measurement 56 (3): 1094. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.167147664&authtype=sso&custid=ns315887.