Study of the drain leakage current in bottom-gated nanocrystalline silicon thin-film transistors by conduction and low frequency noise measurements

MLA

Hatzopoulos, Argyrios T., et al. “Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low Frequency Noise Measurements.” IEEE Transactions on Electron Devices, vol. 54, no. 5, May 2007, p. 1076. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.167191008&authtype=sso&custid=ns315887.

APA

Hatzopoulos, A. T., Arpatzanis, N., Tassis, D. H., Dimitriadis, C. A., Oudwan, M., Templier, F., & Kamarinos, G. (2007). Study of the drain leakage current in bottom-gated nanocrystalline silicon thin-film transistors by conduction and low frequency noise measurements. IEEE Transactions on Electron Devices, 54(5), 1076.

Chicago

Hatzopoulos, Argyrios T., Nikolaos Arpatzanis, Dimitrios H. Tassis, Charalabos A. Dimitriadis, Maher Oudwan, Francois Templier, and George Kamarinos. 2007. “Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low Frequency Noise Measurements.” IEEE Transactions on Electron Devices 54 (5): 1076. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.167191008&authtype=sso&custid=ns315887.