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A deterministic approach to RF noise in silicon devices based on the Langevin-Boltzmann equation

Authors :
Jungemann, Christoph
Source :
IEEE Transactions on Electron Devices. May, 2007, Vol. 54 Issue 5, p1185, 8 p.
Publication Year :
2007

Abstract

A new deterministic approach to electron noise based on a spherical harmonics expansion (SHE) of Langevin-Boltzmann equation in the frequency domain for silicon devices is presented. This approach has many advantages including that it can handle the full frequency range from zero to terahertz, low current levels, and slow processes.

Details

Language :
English
ISSN :
00189383
Volume :
54
Issue :
5
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.167193967