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Impact of scaling on the inverse-mode operation of SiGe HBTs
- Source :
- IEEE Transactions on Electron Devices. June, 2007, Vol. 54 Issue 6, p1492, 10 p.
- Publication Year :
- 2007
-
Abstract
- The inverse mode performance of four distinct generations of SiGe HBTs is investigated and is found to improve impressively with generational scaling. Results show that the improved inverse mode performance with scaling would allow for improved design flexibility and could potentially be use to design novel circuits where speed is not the major driving factor.
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 54
- Issue :
- 6
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.167726930