Growth, structural, and optical properties of II-VI layers: (001) CdMnTe grown by molecular-beam epitaxy

Authors :: Bodin, C.
Cibert, J.
Grieshaber, W.
Dang, Le Si
Marcenat, F.
Wasiela, A.
Jouneau, P.H.
Feuillet, G.
Herve, D.
Molva, E.
Source :: Journal of Applied Physics. Feb 1, 1995, Vol. 77 Issue 3, p1069, 13 p.
Publication Year :: 1995
Abstract: The growth of CdMnTe epilayers is described with emphasis on the misfit strain relaxation and the effect of this strain on the quality and structure of the epilayers. The description is obtained by using transmission electron microscopy, cathodoluminescence imaging and X-ray diffraction methods. The description reveals the correlation between the structural and optical properties of the elastically relaxed layers.

Subjects :: Thin films -- Research
Molecular beams -- Research
Epitaxy -- Research
Physics

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