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Validation of a full-chip simulation model for supply noise and delay dependence on average voltage drop with on-chip delay measurement
- Source :
- IEEE Transactions on Circuits and Systems-II-Express Briefs. Oct, 2007, Vol. 54 Issue 10, p868, 5 p.
- Publication Year :
- 2007
-
Abstract
- Power integrity is a crucial design issue for nano-meter technologies because of decreased supply voltage and increased current. We focused on gate delay variation caused by power/ground noise, and developed a full-chip simulation current model with capacitance and a variable resistor to accurately model current dependency on voltage drop. Measurement results for 90-nm technology are well reproduced in simulation. The error of average supply voltage is 0.9 % in average. Measurement results also demonstrate that gate delay depends on average voltage drop. Index Terms--Delay estimation, full-chip simulation, linear element model, power-supply noise, transistor model.
Details
- Language :
- English
- ISSN :
- 15497747
- Volume :
- 54
- Issue :
- 10
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Circuits and Systems-II-Express Briefs
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.170278607