An x-ray photoelectron spectroscopy and work-function study of the Er/alpha-SiC(001) interface

Subjects

Subjects :

Photoelectron spectroscopy -- Usage
X-rays -- Diffraction
Silicon carbide -- Electric properties
Diodes, Schottky-barrier -- Analysis
Physics

Details

ISSN :

00218979

Volume :

78

Issue :

1

Database :

Gale General OneFile

Journal :

Journal of Applied Physics

Publication Type :

Academic Journal

Accession number :

edsgcl.17156637