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Impact of sampling clock phase noise on [SIGMA][DELTA] frequency discriminators

Authors :
Kwon, Jiuk
Bakkaloglu, Bertan
Source :
IEEE Transactions on Circuits and Systems-II-Express Briefs. Nov, 2007, Vol. 54 Issue 11, p949, 5 p.
Publication Year :
2007

Abstract

[SIGMA][DELTA] frequency discriminators ([SIGMA][DELTA]AFDs) convert instantaneous frequency deviations of a carrier signal to digital. They are used for decoding narrowband phase or frequency modulated signals in communication receivers, self calibration of RF frequency synthesizers and in digital phase locked loops. In this paper, the impact of reference (sampling) clock phase noise on a [SIGMA][DELTA]AFD's spurious-free dynamic range (SFDR) is derived. It is shown that for [SIGMA][DELTA]FDs with jittered sampling clock, in addition to FM sidebands, a high baseband tonal content is generated degrading overall SFDR. The reference clock phase noise impact is derived mathematically, and two commonly used [SIGMA][DELTA]FDs circuits are designed and implemented to verify the results experimentally. Experimental results are shown to match the theoretical prediction of SFDR within 3 dB. Index Terms--Clock Jitter, frequency discriminators, [SIGMA][DELTA]modulators.

Details

Language :
English
ISSN :
15497747
Volume :
54
Issue :
11
Database :
Gale General OneFile
Journal :
IEEE Transactions on Circuits and Systems-II-Express Briefs
Publication Type :
Academic Journal
Accession number :
edsgcl.172051045