Characterization and comparison of high blocking voltage IGBTs and IEGTs under hard- and soft-switching conditions

MLA

Fujii, Kansuke, et al. “Characterization and Comparison of High Blocking Voltage IGBTs and IEGTs under Hard- and Soft-Switching Conditions.” IEEE Transactions on Power Electronics, vol. 23, no. 1, Jan. 2008, p. 172. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.174282880&authtype=sso&custid=ns315887.

APA

Fujii, K., Koellensperger, P., & De Doncker, R. W. (2008). Characterization and comparison of high blocking voltage IGBTs and IEGTs under hard- and soft-switching conditions. IEEE Transactions on Power Electronics, 23(1), 172.

Chicago

Fujii, Kansuke, Peter Koellensperger, and Rik W. De Doncker. 2008. “Characterization and Comparison of High Blocking Voltage IGBTs and IEGTs under Hard- and Soft-Switching Conditions.” IEEE Transactions on Power Electronics 23 (1): 172. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.174282880&authtype=sso&custid=ns315887.