Generation-recombination noise in submicron semiconductor layers: influence of the edges

Subjects

Subjects :

Semiconductors -- Acoustic properties
Electromagnetic noise -- Analysis
Thin films, Multilayered -- Analysis
Physics

Details

ISSN :

00218979

Volume :

78

Issue :

4

Database :

Gale General OneFile

Journal :

Journal of Applied Physics

Publication Type :

Academic Journal

Accession number :

edsgcl.17499780