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Modeling & maximizing burn-in effectiveness

Authors :
Chien, Wei-Ting Kary
Kuo, Way
Source :
IEEE Transactions on Reliability. March, 1995, Vol. 44 Issue 1, p19, 7 p.
Publication Year :
1995

Abstract

A nonlinear model has been developed to find optimal burn-in times for all levels and optimal redundancy for every subsystem. It shows that reliability of the target system can be achieved by lowering the incompatibility or component hazards rates. The system reliability is susceptible to the compatibility level of the initial system. Burn-in times increase due to decreases in burn-in cost because it is more useful to burn-in items than to raise the subsystem numbers.

Details

ISSN :
00189529
Volume :
44
Issue :
1
Database :
Gale General OneFile
Journal :
IEEE Transactions on Reliability
Publication Type :
Academic Journal
Accession number :
edsgcl.17518306