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Self-aligned nickel-mono-silicide technology for high-speed deep submicrometer logic CMOS ULSI
- Source :
- IEEE Transactions on Electron Devices. May, 1995, Vol. 42 Issue 5, p915, 8 p.
- Publication Year :
- 1995
-
Abstract
- Deep sub-micrometer devices, such as logic CMOS ULSI, are constructed using a new technology known as mono-silicidation technology. The device made using this technology has shown better transistor characteristics and propagation delay time than those of titanium salicide. This is because, polysilicon and single-silicon layers have lower contact resistance and sheet resistance. The details of use of nickel-monosilicide technology in making deep sub-micron CMOS are given.
Details
- ISSN :
- 00189383
- Volume :
- 42
- Issue :
- 5
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.17538940