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Self-aligned nickel-mono-silicide technology for high-speed deep submicrometer logic CMOS ULSI

Authors :
Morimoto, Toyota
Ohguro, Tatsuya
Momose, Hisayo Sasaki
Iinuma, Toshihiko
Kunishima, Iwao
Suguro, Kyoichi
Katakabe, Ichiro
Nakajima, Hiroomi
Tsuchiaki, Masakatsu
Ono, Mizuki
Katsumata, Yasuhiro
Iwai, Hiroshi
Source :
IEEE Transactions on Electron Devices. May, 1995, Vol. 42 Issue 5, p915, 8 p.
Publication Year :
1995

Abstract

Deep sub-micrometer devices, such as logic CMOS ULSI, are constructed using a new technology known as mono-silicidation technology. The device made using this technology has shown better transistor characteristics and propagation delay time than those of titanium salicide. This is because, polysilicon and single-silicon layers have lower contact resistance and sheet resistance. The details of use of nickel-monosilicide technology in making deep sub-micron CMOS are given.

Details

ISSN :
00189383
Volume :
42
Issue :
5
Database :
Gale General OneFile
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
edsgcl.17538940