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Counting rates modeling for PET scanners with GATE

Authors :
Guez, David
Bataille, Frederic
Comtat, Claude
Honore, Pierre-Francois
Jan, Sebastien
Kerhoas, Sophie
Source :
IEEE Transactions on Nuclear Science. Feb, 2008, Vol. 55 Issue 1, p516, 8 p.
Publication Year :
2008

Abstract

Several developments were made in the GATE simulation platform to allow accurate modeling of the count rate performances of PET scanners over a wide range of activity concentrations. A background noise module, a dead time and limited bandwidth modeling for the coincidences, and a delayed coincidence builder were added in the code. The results obtained for the modeling of the ECAT HRRT and Focus 220 scanners with the newly developed modules are discussed. They show that GATE can be used to accurately simulate the single event, prompt coincidence and delayed coincidence rates, from very low activity levels in the field of view up to levels that saturate the acquisition system. The new developments were committed into the public release of GATE, making them available for the whole community, thanks to the open source license under which GATE is published (LGPL). Index Terms--Bandwidth, dead time, GATE, Geant4, memory buffer, Monte Carlo simulation, positron emission tomography.

Details

Language :
English
ISSN :
00189499
Volume :
55
Issue :
1
Database :
Gale General OneFile
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
edsgcl.175525078