Structural characterization of ion-beam synthesized NiSi2 layers

Authors :: Wu, M.F.
Wachter, J. de
Bavel, A.-M. van
Moons, R.
Vantomme, A.
Pattyn, H.
Langouche, G.
Bender, H.
Vanhellemont, J.
Temst, K.
Bruynseraede, Y.
Source :: Journal of Applied Physics. August 1, 1995, Vol. 78 Issue 3, p1707, 6 p.
Publication Year :: 1995

Subjects :: Ion bombardment -- Usage
Nickel alloys -- Research
Structural dynamics -- Analysis
Transmission electron microscopes -- Usage
Backscattering -- Usage
Physics

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