Spirobifluorene molecular films investigated by means of near infrared-vacuum ultraviolet spectroscopic ellipsometry

Authors :: Silaghi, Simona D.
Spehr, Till
Cobet, Christoph
Werner, Christoph
Saragi, Tobat P.I.
Salbeck, Josef
Esser, Norbert
Source :: Journal of Applied Physics. Feb 15, 2008, Vol. 103 Issue 4, 043503-1-043503-4
Publication Year :: 2008
Abstract: Spectroscopic ellipsometry in a broad spectral range from near-infrared to vacuum ultraviolet were utilized to study the thin films of spirobifluorene-type materials such as spiro-octol and spiro-octo2. Both organic materials exhibited intense absorption structures in the blue-uv energy range, a property which can find potential use in optoelectronic applications.

Subjects :: Ellipsometry -- Analysis
Fluorine compounds -- Structure
Fluorine compounds -- Optical properties
Fluorine compounds -- Spectra
Dielectric films -- Structure
Dielectric films -- Optical properties
Dielectric films -- Spectra
Thin films -- Structure
Thin films -- Optical properties
Thin films -- Spectra
Absorption spectra -- Analysis
Physics

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