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Dielectric-parameter measurements of SiC at millimeter and submillimeter wavelengths

Authors :
Shu Chen
Afsar, Mohammed N.
Sakdatorn, Darin
Source :
IEEE Transactions on Instrumentation & Measurement. April, 2008, Vol. 57 Issue 4, p706, 10 p.
Publication Year :
2008

Details

Language :
English
ISSN :
00189456
Volume :
57
Issue :
4
Database :
Gale General OneFile
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
edsgcl.178842107