Back to Search
Start Over
Dielectric-parameter measurements of SiC at millimeter and submillimeter wavelengths
- Source :
- IEEE Transactions on Instrumentation & Measurement. April, 2008, Vol. 57 Issue 4, p706, 10 p.
- Publication Year :
- 2008
Details
- Language :
- English
- ISSN :
- 00189456
- Volume :
- 57
- Issue :
- 4
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Instrumentation & Measurement
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.178842107