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Direct imaging of current-induced domain wall motion in CoFeB structures
- Source :
- Journal of Applied Physics. April 1, 2008, Vol. 103 Issue 7, 07D928-1-07D928-3
- Publication Year :
- 2008
-
Abstract
- X-ray photoemission electron microscopy is used for probing current-induced domain wall motion in CoFeB wires. The studies have shown that the domain wall pinning is due to edge roughness and not due to pinning at intrinsic grain boundaries, which is absent in CoFeB.
- Subjects :
- X-ray microscopy -- Usage
Cobalt alloys -- Structure
Iron -- Structure
Physics
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 103
- Issue :
- 7
- Database :
- Gale General OneFile
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.180532257