Using x-ray diffraction to identify precipitates in transition metal doped semiconductors

Authors :: Shengqiang Zhou
Potzger, K.
Talut, G.
von Borany, J.
Skorupa, W.
Helm, M.
Fassbender, J.
Source :: Journal of Applied Physics. April 1, 2008, Vol. 103 Issue 7, 07D530-1-07D530-3
Publication Year :: 2008
Abstract: The structural and magnetic properties are correlated in order to analyze the formation of transition metal (Co, Ni) and Mn-silicide nanocrystals in semiconductors. The difficulties in probing nanocrystals of small amount are generalized by using x-ray diffraction (XRD) method.

Subjects :: Cobalt -- Magnetic properties
Manganese alloys -- Magnetic properties
Manganese alloys -- Structure
Semiconductors -- Magnetic properties
Semiconductors -- Composition
X-rays -- Diffraction
X-rays -- Usage
Physics

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