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Origin of negative differential resistance and memory characteristics in organic devices based on tris(8-hydroxyquinoline) aluminum

Authors :
Jian Lin
Dongge Ma
Source :
Journal of Applied Physics. June 15, 2008, Vol. 103 Issue 12, 124505-1-124505-4
Publication Year :
2008

Abstract

The fabrication and characterization of stable negative differential resistance (NDR) devices based on tris(8-hydroxyquinoline) aluminum ([Alq.sub.3]) are described. The studies have shown that injection of holes in these devices have played a vital role in NDR and resistive switching processes.

Details

Language :
English
ISSN :
00218979
Volume :
103
Issue :
12
Database :
Gale General OneFile
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
edsgcl.182176789