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Turn-off failures in individual and paralleled MCT's

Authors :
Afridi, Khurram K.
Kassakian, John G.
Source :
IEEE Transactions on Power Electronics. March, 1996, Vol. 11 Issue 2, p299, 5 p.
Publication Year :
1996

Subjects

Subjects :
Thyristors -- Research
Metal oxide semiconductors -- Research
Gates (Electronics) -- Research
Business
Electronics
Electronics and electrical industries

Details

ISSN :
08858993
Volume :
11
Issue :
2
Database :
Gale General OneFile
Journal :
IEEE Transactions on Power Electronics
Publication Type :
Academic Journal
Accession number :
edsgcl.18253857

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