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A study of an AIEM model for bistatic scattering from randomly rough surfaces
- Source :
- IEEE Transactions on Geoscience and Remote Sensing. Sept, 2008, Vol. 46 Issue 9, p2584, 15 p.
- Publication Year :
- 2008
-
Abstract
- In this paper, we study the bistatic scattering using an advanced integral equation model (AIEM). By keeping all the surface current terms in the Kirchhoff surface fields, the bistatic scattering coefficients are obtained. For simplification, the complete Kirchhoff field did not cast into the derivation of the complementary field. We compare varied updated versions of IEM-based models with the small perturbation model, geometrical optics model, and Kirchhoff approximation standard models at respective regions of validity. The results indicate that the new AIEM provides much more accurate predictions for bistatic scattering. Index Terms--Bistatic scattering, geometrical optics model (GOM), integral equation model (IEM), Kirchhoff approximation (KA), rough surface, small perturbation model (SPM).
- Subjects :
- Approximation theory -- Methods
Surface roughness -- Influence
Integral equations -- Evaluation
Integral equations -- Models
Electromagnetic waves -- Scattering
Electromagnetic waves -- Evaluation
Optics, Geometrical -- Research
Business
Earth sciences
Electronics and electrical industries
Subjects
Details
- Language :
- English
- ISSN :
- 01962892
- Volume :
- 46
- Issue :
- 9
- Database :
- Gale General OneFile
- Journal :
- IEEE Transactions on Geoscience and Remote Sensing
- Publication Type :
- Academic Journal
- Accession number :
- edsgcl.185428718