Reduced invasiveness of noncontact electrooptic probes in millimeter-wave optoelectronic characterization

MLA

Zeng, A., et al. “Reduced Invasiveness of Noncontact Electrooptic Probes in Millimeter-Wave Optoelectronic Characterization.” IEEE Transactions on Microwave Theory and Techniques, vol. 44, no. 7, July 1996, p. 1155. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.18625675&authtype=sso&custid=ns315887.

APA

Zeng, A., Shah, S. A., & Jackson, M. K. (1996). Reduced invasiveness of noncontact electrooptic probes in millimeter-wave optoelectronic characterization. IEEE Transactions on Microwave Theory and Techniques, 44(7), 1155.

Chicago

Zeng, A., S.A. Shah, and M.K. Jackson. 1996. “Reduced Invasiveness of Noncontact Electrooptic Probes in Millimeter-Wave Optoelectronic Characterization.” IEEE Transactions on Microwave Theory and Techniques 44 (7): 1155. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsggo&AN=edsgcl.18625675&authtype=sso&custid=ns315887.